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FADES: a fault emulation tool for fast dependability assessment

David de Andrés, Juan Carlos Ruiz, Daniel Gil, Pedro J. Gil. FADES: a fault emulation tool for fast dependability assessment. In George A. Constantinides, Wai-Kei Mak, Phaophak Sirisuk, Theerayod Wiangtong, editors, 2006 IEEE International Conference on Field Programmable Technology, FPT 2006, Bangkok, Thailand, December 13-15, 2006. pages 221-228, IEEE, 2006. [doi]

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David de Andrés

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Juan Carlos Ruiz

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Daniel Gil

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Pedro J. Gil

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