David de Andrés, Juan Carlos Ruiz, Daniel Gil, Pedro J. Gil. FADES: a fault emulation tool for fast dependability assessment. In George A. Constantinides, Wai-Kei Mak, Phaophak Sirisuk, Theerayod Wiangtong, editors, 2006 IEEE International Conference on Field Programmable Technology, FPT 2006, Bangkok, Thailand, December 13-15, 2006. pages 221-228, IEEE, 2006. [doi]
@inproceedings{AndresRGG06-0,
title = {FADES: a fault emulation tool for fast dependability assessment},
author = {David de Andrés and Juan Carlos Ruiz and Daniel Gil and Pedro J. Gil},
year = {2006},
doi = {10.1109/FPT.2006.270315},
url = {http://dx.doi.org/10.1109/FPT.2006.270315},
researchr = {https://researchr.org/publication/AndresRGG06-0},
cites = {0},
citedby = {0},
pages = {221-228},
booktitle = {2006 IEEE International Conference on Field Programmable Technology, FPT 2006, Bangkok, Thailand, December 13-15, 2006},
editor = {George A. Constantinides and Wai-Kei Mak and Phaophak Sirisuk and Theerayod Wiangtong},
publisher = {IEEE},
isbn = {0-7803-9728-2},
}