David de Andrés, Juan Carlos Ruiz, Daniel Gil, Pedro J. Gil. FADES: a fault emulation tool for fast dependability assessment. In George A. Constantinides, Wai-Kei Mak, Phaophak Sirisuk, Theerayod Wiangtong, editors, 2006 IEEE International Conference on Field Programmable Technology, FPT 2006, Bangkok, Thailand, December 13-15, 2006. pages 221-228, IEEE, 2006. [doi]
Abstract is missing.