Fabrication and characterization of robust through-silicon vias for silicon-carrier applications

Paul S. Andry, Cornelia K. Tsang, Bucknell C. Webb, Edmund J. Sprogis, Steven L. Wright, Bing Dang, Dennis G. Manzer. Fabrication and characterization of robust through-silicon vias for silicon-carrier applications. IBM Journal of Research and Development, 52(6):571-581, 2008. [doi]

@article{AndryTWSWDM08,
  title = {Fabrication and characterization of robust through-silicon vias for silicon-carrier applications},
  author = {Paul S. Andry and Cornelia K. Tsang and Bucknell C. Webb and Edmund J. Sprogis and Steven L. Wright and Bing Dang and Dennis G. Manzer},
  year = {2008},
  doi = {10.1147/JRD.2008.5388558},
  url = {http://dx.doi.org/10.1147/JRD.2008.5388558},
  tags = {C++},
  researchr = {https://researchr.org/publication/AndryTWSWDM08},
  cites = {0},
  citedby = {0},
  journal = {IBM Journal of Research and Development},
  volume = {52},
  number = {6},
  pages = {571-581},
}