F. Angione, D. Appello, J. Aribido, J. Athavale, N. Bellarmino, P. Bernardi, R. Cantoro, C. De Sio, T. Foscale, G. Gavarini, J. Guerrero, M. Huch, G. Iaria, T. Kilian, R. Mariani, R. Martone, A. Ruospo, E. Sanchez, U. Schlichtmann, G. Squillero, M. Sonza Reorda, L. Sterpone, V. Tancorre, R. Ugioli. Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In IEEE European Test Symposium, ETS 2022, Barcelona, Spain, May 23-27, 2022. pages 1-10, IEEE, 2022. [doi]
@inproceedings{AngioneAAABBCSF22,
title = {Test, Reliability and Functional Safety Trends for Automotive System-on-Chip},
author = {F. Angione and D. Appello and J. Aribido and J. Athavale and N. Bellarmino and P. Bernardi and R. Cantoro and C. De Sio and T. Foscale and G. Gavarini and J. Guerrero and M. Huch and G. Iaria and T. Kilian and R. Mariani and R. Martone and A. Ruospo and E. Sanchez and U. Schlichtmann and G. Squillero and M. Sonza Reorda and L. Sterpone and V. Tancorre and R. Ugioli},
year = {2022},
doi = {10.1109/ETS54262.2022.9810388},
url = {https://doi.org/10.1109/ETS54262.2022.9810388},
researchr = {https://researchr.org/publication/AngioneAAABBCSF22},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {IEEE European Test Symposium, ETS 2022, Barcelona, Spain, May 23-27, 2022},
publisher = {IEEE},
isbn = {978-1-6654-6706-3},
}