F. Angione, D. Appello, J. Aribido, J. Athavale, N. Bellarmino, P. Bernardi, R. Cantoro, C. De Sio, T. Foscale, G. Gavarini, J. Guerrero, M. Huch, G. Iaria, T. Kilian, R. Mariani, R. Martone, A. Ruospo, E. Sanchez, U. Schlichtmann, G. Squillero, M. Sonza Reorda, L. Sterpone, V. Tancorre, R. Ugioli. Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In IEEE European Test Symposium, ETS 2022, Barcelona, Spain, May 23-27, 2022. pages 1-10, IEEE, 2022. [doi]
Abstract is missing.