A guided debugger-based fault injection methodology for assessing functional test programs

Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre. A guided debugger-based fault injection methodology for assessing functional test programs. In 41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023. pages 1-7, IEEE, 2023. [doi]

Authors

Francesco Angione

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Paolo Bernardi

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Nicola Di Gruttola Giardino

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Davide Appello

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Claudia Bertani

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Vincenzo Tancorre

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