Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre. A guided debugger-based fault injection methodology for assessing functional test programs. In 41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023. pages 1-7, IEEE, 2023. [doi]
Abstract is missing.