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Aging-Induced Failure Prognosis via Digital Sensors

Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi. Aging-Induced Failure Prognosis via Digital Sensors. In Himanshu Thapliyal, Ronald F. DeMara, Inna Partin-Vaisband, Srinivas Katkoori, editors, Proceedings of the Great Lakes Symposium on VLSI 2023, GLSVLSI 2023, Knoxville, TN, USA, June 5-7, 2023. pages 703-708, ACM, 2023. [doi]

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Md Toufiq Hasan Anik

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Hasin Ishraq Reefat

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Jean-Luc Danger

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Sylvain Guilley

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Naghmeh Karimi

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