Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi. Aging-Induced Failure Prognosis via Digital Sensors. In Himanshu Thapliyal, Ronald F. DeMara, Inna Partin-Vaisband, Srinivas Katkoori, editors, Proceedings of the Great Lakes Symposium on VLSI 2023, GLSVLSI 2023, Knoxville, TN, USA, June 5-7, 2023. pages 703-708, ACM, 2023. [doi]
@inproceedings{AnikRDGK23,
title = {Aging-Induced Failure Prognosis via Digital Sensors},
author = {Md Toufiq Hasan Anik and Hasin Ishraq Reefat and Jean-Luc Danger and Sylvain Guilley and Naghmeh Karimi},
year = {2023},
doi = {10.1145/3583781.3590204},
url = {https://doi.org/10.1145/3583781.3590204},
researchr = {https://researchr.org/publication/AnikRDGK23},
cites = {0},
citedby = {0},
pages = {703-708},
booktitle = {Proceedings of the Great Lakes Symposium on VLSI 2023, GLSVLSI 2023, Knoxville, TN, USA, June 5-7, 2023},
editor = {Himanshu Thapliyal and Ronald F. DeMara and Inna Partin-Vaisband and Srinivas Katkoori},
publisher = {ACM},
}