Layout-aware 2-step window-based pattern reordering for fast bridge/open test generation - researchr publication authors

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Masayuki Arai, Shingo Inuyama, Kazuhiko Iwasaki. Layout-aware 2-step window-based pattern reordering for fast bridge/open test generation. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-8, IEEE, 2017. [doi]

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