Masayuki Arai, Shingo Inuyama, Kazuhiko Iwasaki. Layout-aware 2-step window-based pattern reordering for fast bridge/open test generation. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-8, IEEE, 2017. [doi]
Abstract is missing.