Masayuki Arai, Shingo Inuyama, Kazuhiko Iwasaki. Layout-aware 2-step window-based pattern reordering for fast bridge/open test generation. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-8, IEEE, 2017. [doi]
@inproceedings{AraiII17,
title = {Layout-aware 2-step window-based pattern reordering for fast bridge/open test generation},
author = {Masayuki Arai and Shingo Inuyama and Kazuhiko Iwasaki},
year = {2017},
doi = {10.1109/TEST.2017.8242060},
url = {https://doi.org/10.1109/TEST.2017.8242060},
researchr = {https://researchr.org/publication/AraiII17},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017},
publisher = {IEEE},
isbn = {978-1-5386-3413-4},
}