Nanomechanical mass sensor for monitoring deposition rates through confined apertures

Julien Arcamone, Marc Sansa, Jaume Verd, Arantxa Uranga, Gabriel Abadal, Nuria Barniol, Marc A. F. van den Boogaart, Juergen Brugger, Francesc Pérez-Murano. Nanomechanical mass sensor for monitoring deposition rates through confined apertures. In 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE-NEMS 2009, Shenzhen, China, January 5-8, 2009. pages 94-97, IEEE, 2009. [doi]

@inproceedings{ArcamoneSVUABBBP09,
  title = {Nanomechanical mass sensor for monitoring deposition rates through confined apertures},
  author = {Julien Arcamone and Marc Sansa and Jaume Verd and Arantxa Uranga and Gabriel Abadal and Nuria Barniol and Marc A. F. van den Boogaart and Juergen Brugger and Francesc Pérez-Murano},
  year = {2009},
  doi = {10.1109/NEMS.2009.5068534},
  url = {http://doi.ieeecomputersociety.org/10.1109/NEMS.2009.5068534},
  researchr = {https://researchr.org/publication/ArcamoneSVUABBBP09},
  cites = {0},
  citedby = {0},
  pages = {94-97},
  booktitle = {4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE-NEMS 2009, Shenzhen, China, January 5-8, 2009},
  publisher = {IEEE},
  isbn = {978-1-4244-4629-2},
}