Knowledge Based Qualification for Thermal Interface Material Reliability

E. Armagan, A. Saha, K. C. Liu, B. Gebrehiwot, M. Cartas, A. Das, T. Rawlings, P. Raghavan. Knowledge Based Qualification for Thermal Interface Material Reliability. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-7, IEEE, 2023. [doi]

Abstract

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