Test control algorithms for the validation of cyber-physical systems product lines

Aitor Arrieta, Goiuria Sagardui, Leire Etxeberria. Test control algorithms for the validation of cyber-physical systems product lines. In Douglas C. Schmidt, editor, Proceedings of the 19th International Conference on Software Product Line, SPLC 2015, Nashville, TN, USA, July 20-24, 2015. pages 273-282, ACM, 2015. [doi]

Authors

Aitor Arrieta

This author has not been identified. Look up 'Aitor Arrieta' in Google

Goiuria Sagardui

This author has not been identified. Look up 'Goiuria Sagardui' in Google

Leire Etxeberria

This author has not been identified. Look up 'Leire Etxeberria' in Google