Aitor Arrieta, Goiuria Sagardui, Leire Etxeberria. Test control algorithms for the validation of cyber-physical systems product lines. In Douglas C. Schmidt, editor, Proceedings of the 19th International Conference on Software Product Line, SPLC 2015, Nashville, TN, USA, July 20-24, 2015. pages 273-282, ACM, 2015. [doi]
Abstract is missing.