Aitor Arrieta, Goiuria Sagardui, Leire Etxeberria. Test control algorithms for the validation of cyber-physical systems product lines. In Douglas C. Schmidt, editor, Proceedings of the 19th International Conference on Software Product Line, SPLC 2015, Nashville, TN, USA, July 20-24, 2015. pages 273-282, ACM, 2015. [doi]
@inproceedings{ArrietaSE15,
title = {Test control algorithms for the validation of cyber-physical systems product lines},
author = {Aitor Arrieta and Goiuria Sagardui and Leire Etxeberria},
year = {2015},
doi = {10.1145/2791060.2791095},
url = {http://doi.acm.org/10.1145/2791060.2791095},
researchr = {https://researchr.org/publication/ArrietaSE15},
cites = {0},
citedby = {0},
pages = {273-282},
booktitle = {Proceedings of the 19th International Conference on Software Product Line, SPLC 2015, Nashville, TN, USA, July 20-24, 2015},
editor = {Douglas C. Schmidt},
publisher = {ACM},
isbn = {978-1-4503-3613-0},
}