Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman. Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(2):301-312, 2013. [doi]
Abstract is missing.