Reliability-aware design for nanometer-scale devices - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

David Atienza, Giovanni De Micheli, Luca Benini, José L. Ayala, Pablo Garcia Del Valle, Michael DeBole, Vijay Narayanan. Reliability-aware design for nanometer-scale devices. In Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008. pages 549-554, IEEE, 2008. [doi]

This author has not been identified. Look up 'David Atienza' in GoogleThis author has not been identified. Look up 'Giovanni De Micheli' in GoogleThis author has not been identified. It may be one of the following persons:

Luca Benini

Look up 'Luca Benini' in GoogleThis author has not been identified. Look up 'José L. Ayala' in GoogleThis author has not been identified. Look up 'Pablo Garcia Del Valle' in GoogleThis author has not been identified. Look up 'Michael DeBole' in GoogleThis author has not been identified. Look up 'Vijay Narayanan' in Google

runs on WebDSL