David Atienza, Giovanni De Micheli, Luca Benini, José L. Ayala, Pablo Garcia Del Valle, Michael DeBole, Vijay Narayanan. Reliability-aware design for nanometer-scale devices. In Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008. pages 549-554, IEEE, 2008. [doi]
Abstract is missing.