David Atienza, Giovanni De Micheli, Luca Benini, José L. Ayala, Pablo Garcia Del Valle, Michael DeBole, Vijay Narayanan. Reliability-aware design for nanometer-scale devices. In Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008. pages 549-554, IEEE, 2008. [doi]
@inproceedings{AtienzaMBAVDN08,
title = {Reliability-aware design for nanometer-scale devices},
author = {David Atienza and Giovanni De Micheli and Luca Benini and José L. Ayala and Pablo Garcia Del Valle and Michael DeBole and Vijay Narayanan},
year = {2008},
doi = {10.1109/ASPDAC.2008.4484011},
url = {http://dx.doi.org/10.1109/ASPDAC.2008.4484011},
tags = {context-aware, reliability, design},
researchr = {https://researchr.org/publication/AtienzaMBAVDN08},
cites = {0},
citedby = {0},
pages = {549-554},
booktitle = {Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008},
publisher = {IEEE},
}