An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs - researchr publication authors

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Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei. An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. IEEE Design & Test of Computers, 20(1):60-67, 2003. [doi]

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