An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs

Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei. An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. IEEE Design & Test of Computers, 20(1):60-67, 2003. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.