A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction - researchr publication authors

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Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault. A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction. J. Electronic Testing, 24(4):353-364, 2008. [doi]

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