Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault. A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction. J. Electronic Testing, 24(4):353-364, 2008. [doi]
@article{BadereddineWGCVPL08,
title = {A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction},
author = {Nabil Badereddine and Zhanglei Wang and Patrick Girard and Krishnendu Chakrabarty and Arnaud Virazel and Serge Pravossoudovitch and Christian Landrault},
year = {2008},
doi = {10.1007/s10836-007-5053-z},
url = {http://dx.doi.org/10.1007/s10836-007-5053-z},
tags = {testing, slicing},
researchr = {https://researchr.org/publication/BadereddineWGCVPL08},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {24},
number = {4},
pages = {353-364},
}