Gate delay modeling for static timing analysis of body-biased circuits

Donkyu Baek, Insup Shin, Youngsoo Shin. Gate delay modeling for static timing analysis of body-biased circuits. In IEEE International Conference on IC Design & Technology, ICICDT 2012, Austin, TX, USA, May 30 - June 1, 2012. pages 1-4, IEEE, 2012. [doi]

Authors

Donkyu Baek

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Insup Shin

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Youngsoo Shin

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