Donkyu Baek, Insup Shin, Youngsoo Shin. Gate delay modeling for static timing analysis of body-biased circuits. In IEEE International Conference on IC Design & Technology, ICICDT 2012, Austin, TX, USA, May 30 - June 1, 2012. pages 1-4, IEEE, 2012. [doi]
@inproceedings{BaekSS12,
title = {Gate delay modeling for static timing analysis of body-biased circuits},
author = {Donkyu Baek and Insup Shin and Youngsoo Shin},
year = {2012},
doi = {10.1109/ICICDT.2012.6232836},
url = {http://dx.doi.org/10.1109/ICICDT.2012.6232836},
researchr = {https://researchr.org/publication/BaekSS12},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE International Conference on IC Design & Technology, ICICDT 2012, Austin, TX, USA, May 30 - June 1, 2012},
publisher = {IEEE},
isbn = {978-1-4673-0146-6},
}