Gate delay modeling for static timing analysis of body-biased circuits

Donkyu Baek, Insup Shin, Youngsoo Shin. Gate delay modeling for static timing analysis of body-biased circuits. In IEEE International Conference on IC Design & Technology, ICICDT 2012, Austin, TX, USA, May 30 - June 1, 2012. pages 1-4, IEEE, 2012. [doi]

Abstract

Abstract is missing.