Measurement of the Switching Activity of CMOS Digital Circuits at the Gate Level

C. Baena, Jorge Juan-Chico, Manuel J. Bellido, Paulino Ruiz-de-Clavijo, Carlos J. Jiménez, Manuel Valencia. Measurement of the Switching Activity of CMOS Digital Circuits at the Gate Level. In Bertrand Hochet, Antonio J. Acosta, Manuel J. Bellido, editors, Integrated Circuit Design. Power and Timing Modeling, Optimization and Simulation, 12th International Workshop, PATMOS 2002, Seville, Spain, September 11-13, 2002. Volume 2451 of Lecture Notes in Computer Science, pages 353-362, Springer, 2002. [doi]

@inproceedings{BaenaJBCJV02,
  title = {Measurement of the Switching Activity of CMOS Digital Circuits at the Gate Level},
  author = {C. Baena and Jorge Juan-Chico and Manuel J. Bellido and Paulino Ruiz-de-Clavijo and Carlos J. Jiménez and Manuel Valencia},
  year = {2002},
  url = {http://springerlink.metapress.com/openurl.asp?genre=article&issn=0302-9743&volume=2451&spage=0353},
  tags = {C++},
  researchr = {https://researchr.org/publication/BaenaJBCJV02},
  cites = {0},
  citedby = {0},
  pages = {353-362},
  booktitle = {Integrated Circuit Design. Power and Timing Modeling, Optimization and Simulation, 12th International Workshop, PATMOS 2002, Seville, Spain, September 11-13, 2002},
  editor = {Bertrand Hochet and Antonio J. Acosta and Manuel J. Bellido},
  volume = {2451},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {3-540-44143-3},
}