Symbolic failure analysis of complex CMOS circuits due to excessive leakage current and charge sharing - researchr publication

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R. Iris Bahar, Hui-Yuan Song, Kundan Nepal, Joel Grodstein. Symbolic failure analysis of complex CMOS circuits due to excessive leakage current and charge sharing. IEEE Trans. on CAD of Integrated Circuits and Systems, 24(4):502-515, 2005. [doi]

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