Challenges at 45nm and beyond - researchr publication authors

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Dan Bailey, Eric Soenen, Puneet Gupta, Paul G. Villarrubia, Sang H. Dhong. Challenges at 45nm and beyond. In Sani R. Nassif, Jaijeet S. Roychowdhury, editors, 2008 International Conference on Computer-Aided Design (ICCAD 08), November 10-13, 2008, San Jose, CA, USA. pages 7, IEEE, 2008. [doi]

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