Challenges at 45nm and beyond

Dan Bailey, Eric Soenen, Puneet Gupta, Paul G. Villarrubia, Sang H. Dhong. Challenges at 45nm and beyond. In Sani R. Nassif, Jaijeet S. Roychowdhury, editors, 2008 International Conference on Computer-Aided Design (ICCAD 08), November 10-13, 2008, San Jose, CA, USA. pages 7, IEEE, 2008. [doi]

Abstract

Abstract is missing.