Dimitris Bakalis, Dimitris Nikolos, Haridimos T. Vergos, Xrysovalantis Kavousianos. On Accumulator-Based Bit-Serial Test Response Compaction Schemes. In 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 26-28 March 2001, San Jose, CA, USA. pages 350, IEEE Computer Society, 2001. [doi]
Abstract is missing.