Nicodemus Banagaaya, Liong Feng, Wim Schoenmaker, Peter Meuris, Aarnout Wieers, Renaud Gillon, Peter Benner. Model Order Reduction for nanoelectronics coupled problems with many inputs. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 313-318, IEEE, 2016. [doi]
Abstract is missing.