Transient latch-up: experimental analysis and device simulation - researchr publication authors

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S. Bargstädt-Franke, Wolfgang Stadler, K. Esmark, M. Streibl, K. Domanski, Horst A. Gieser, Heinrich Wolf, W. Bala. Transient latch-up: experimental analysis and device simulation. Microelectronics Reliability, 45(2):297-304, 2005. [doi]

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