S. Bargstädt-Franke, Wolfgang Stadler, K. Esmark, M. Streibl, K. Domanski, Horst A. Gieser, Heinrich Wolf, W. Bala. Transient latch-up: experimental analysis and device simulation. Microelectronics Reliability, 45(2):297-304, 2005. [doi]
@article{Bargstadt-FrankeSESDGWB05,
title = {Transient latch-up: experimental analysis and device simulation},
author = {S. Bargstädt-Franke and Wolfgang Stadler and K. Esmark and M. Streibl and K. Domanski and Horst A. Gieser and Heinrich Wolf and W. Bala},
year = {2005},
doi = {10.1016/j.microrel.2004.05.017},
url = {http://dx.doi.org/10.1016/j.microrel.2004.05.017},
tags = {analysis},
researchr = {https://researchr.org/publication/Bargstadt-FrankeSESDGWB05},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {45},
number = {2},
pages = {297-304},
}