Redundancy Implications for Early-Life Reliability: Experimental Verification of an Integrated Yield-Reliability Model - researchr publication authors

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Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh. Redundancy Implications for Early-Life Reliability: Experimental Verification of an Integrated Yield-Reliability Model. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 693-699, IEEE Computer Society, 2002. [doi]

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