Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh. Redundancy Implications for Early-Life Reliability: Experimental Verification of an Integrated Yield-Reliability Model. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 693-699, IEEE Computer Society, 2002. [doi]
Abstract is missing.