Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh. Redundancy Implications for Early-Life Reliability: Experimental Verification of an Integrated Yield-Reliability Model. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 693-699, IEEE Computer Society, 2002. [doi]
@inproceedings{BarnettGPS02,
title = {Redundancy Implications for Early-Life Reliability: Experimental Verification of an Integrated Yield-Reliability Model},
author = {Thomas S. Barnett and Matt Grady and Kathleen G. Purdy and Adit D. Singh},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430693abs.htm},
tags = {redundancy, reliability},
researchr = {https://researchr.org/publication/BarnettGPS02},
cites = {0},
citedby = {0},
pages = {693-699},
booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
publisher = {IEEE Computer Society},
}