Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm

Thomas Bartenstein, Douglas Heaberlin, Leendert M. Huisman, David Sliwinski. Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 287-296, IEEE Computer Society, 2001.

Authors

Thomas Bartenstein

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Douglas Heaberlin

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Leendert M. Huisman

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David Sliwinski

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