Thomas Bartenstein, Douglas Heaberlin, Leendert M. Huisman, David Sliwinski. Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 287-296, IEEE Computer Society, 2001.
@inproceedings{BartensteinHHS01,
title = {Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm},
author = {Thomas Bartenstein and Douglas Heaberlin and Leendert M. Huisman and David Sliwinski},
year = {2001},
tags = {logic},
researchr = {https://researchr.org/publication/BartensteinHHS01},
cites = {0},
citedby = {0},
pages = {287-296},
booktitle = {Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001},
publisher = {IEEE Computer Society},
isbn = {0-7803-7169-0},
}