Thomas Bartenstein, Douglas Heaberlin, Leendert M. Huisman, David Sliwinski. Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 287-296, IEEE Computer Society, 2001.
Abstract is missing.