The following publications are possibly variants of this publication:
- Methodology to determine the impact of linewidth variation on chip scale copper/low-k backend dielectric breakdownMuhammad Bashir, Linda S. Milor, Dae-Hyun Kim, Sung Kyu Lim. mr, 50(9-11):1341-1346, 2010. [doi]
- Impact of irregular geometries on low-k dielectric breakdownMuhammad Bashir, Linda Milor, Dae-Hyun Kim, Sung Kyu Lim. mr, 51(9-11):1582-1586, 2011. [doi]
- Modeling of the breakdown mechanisms for porous copper/low-k process flowsChangsoo Hong, Linda Milor. mr, 47(9-11):1478-1482, 2007. [doi]