Magali Bastian, Vincent Gouin, Patrick Girard 0001, Christian Landrault, Alexandre Ney, Serge Pravossoudovitch, Arnaud Virazel. Influence of Threshold Voltage Deviations on 90nm SRAM Core-Cell Behavior. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 507-510, IEEE, 2007. [doi]
Abstract is missing.