Anupam Basu, Thomas Charles Wilson, Dilip K. Banerji, Jayanti C. Majithia. Integrated approach to area-time tradeoff for built-in-self-test in VLSI circuits. In First Great Lakes Symposium on VLSI, 1991, Kalamazoo, MI, USA, March 1-2, 1991. pages 340-341, IEEE, 1991. [doi]
@inproceedings{BasuWBM91,
title = {Integrated approach to area-time tradeoff for built-in-self-test in VLSI circuits},
author = {Anupam Basu and Thomas Charles Wilson and Dilip K. Banerji and Jayanti C. Majithia},
year = {1991},
doi = {10.1109/GLSV.1991.143994},
url = {http://dx.doi.org/10.1109/GLSV.1991.143994},
researchr = {https://researchr.org/publication/BasuWBM91},
cites = {0},
citedby = {0},
pages = {340-341},
booktitle = {First Great Lakes Symposium on VLSI, 1991, Kalamazoo, MI, USA, March 1-2, 1991},
publisher = {IEEE},
isbn = {0-8186-2170-2},
}