Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased - researchr publication authors

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Felix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, D. Lewis. Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectronics Reliability, 42(9-11):1729-1734, 2002. [doi]

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