Felix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, D. Lewis. Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectronics Reliability, 42(9-11):1729-1734, 2002. [doi]
@article{BeaudoinHPDBL02,
title = {Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased},
author = {Felix Beaudoin and G. Haller and Philippe Perdu and Romain Desplats and T. Beauchêne and D. Lewis},
year = {2002},
doi = {10.1016/S0026-2714(02)00221-4},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00221-4},
tags = {reliability},
researchr = {https://researchr.org/publication/BeaudoinHPDBL02},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {42},
number = {9-11},
pages = {1729-1734},
}