Jens Behley, Kristian Kersting, Dirk Schulz, Volker Steinhage, Armin B. Cremers. Learning to hash logistic regression for fast 3D scan point classification. In 2010 IEEE/RSJ International Conference on Intelligent Robots and Systems, October 18-22, 2010, Taipei, Taiwan. pages 5960-5965, IEEE, 2010. [doi]
Abstract is missing.