Learning to hash logistic regression for fast 3D scan point classification

Jens Behley, Kristian Kersting, Dirk Schulz, Volker Steinhage, Armin B. Cremers. Learning to hash logistic regression for fast 3D scan point classification. In 2010 IEEE/RSJ International Conference on Intelligent Robots and Systems, October 18-22, 2010, Taipei, Taiwan. pages 5960-5965, IEEE, 2010. [doi]

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